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73416ba
(Get the code!)
Attached is the output of smartctl and screenshot. Dell XPS 1330 using Samsung HM250JI.
anant@anant-
[sudo] password for anant:
smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HM250JI
Serial Number: S133JD0Q160378
Firmware Version: HS100-11
User Capacity: 250,059,350,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Tue Nov 3 06:37:03 2009 CST
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 32) The self-test routine was interrupted
by the host with a hard or soft reset.
Total time to complete Offline
data collection: ( 103) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 103) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 1
3 Spin_Up_Time 0x0007 252 252 025 Pre-fail Always - 2625
4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 37233
5 Reallocated_
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 1131
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1036
191 G-Sense_Error_Rate 0x0032 041 041 000 Old_age Always - 596620
192 Power-Off_
194 Temperature_Celsius 0x0022 154 085 000 Old_age Always - 28 (Lifetime Min/Max 7/51)
196 Reallocated_
197 Current_
198 Offline_
199 UDMA_CRC_
200 Multi_Zone_
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 1127 -
# 2 Short offline Completed without error 00% 1114 -
# 3 Extended offline Completed without error 00% 1113 -
# 4 Short offline Completed without error 00% 3 -
# 5 Short offline Completed without error 00% 1 -
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Interrupted [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
anant@anant-
Anant