smartctl 6.6 2016-05-31 r4324 [x86_64-linux-5.4.0-42-generic] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: HITACHI HTS723232L9SA60 Serial Number: 090905FC1420NEHGNGVG LU WWN Device Id: 5 000cca 582d4c193 Firmware Version: FC4ZC50B User Capacity: 320 072 933 376 bytes [320 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 7200 rpm Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS T13/1699-D revision 3f SATA Version is: SATA 2.6, 1.5 Gb/s Local Time is: Sat Aug 1 11:38:04 2020 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 96) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 232 232 033 Pre-fail Always - 1 4 Start_Stop_Count 0x0012 098 098 000 Old_age Always - 4381 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 001 001 000 Old_age Always - 46212 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 2601 191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 5636261 193 Load_Cycle_Count 0x0012 092 092 000 Old_age Always - 84925 194 Temperature_Celsius 0x0002 127 127 000 Old_age Always - 43 (Min/Max 7/57) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 8 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 8 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 1f 0e 43 e0 Error: IDNF at LBA = 0x00430e1f = 4394527 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 24 ff 01 1f 0e 43 e0 00 00:04:29.800 READ SECTOR(S) EXT 25 ff 01 1f 0e 43 e0 00 00:04:29.700 READ DMA EXT 34 ff 01 00 00 00 e0 00 00:04:29.600 WRITE SECTORS(S) EXT 25 ff 01 00 00 00 e0 00 00:04:29.600 READ DMA EXT 25 ff 01 10 3b 00 e0 00 00:04:29.600 READ DMA EXT Error 7 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 1f 0e 43 e0 Error: IDNF 1 sectors at LBA = 0x00430e1f = 4394527 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 ff 01 1f 0e 43 e0 00 00:04:29.700 READ DMA EXT 34 ff 01 00 00 00 e0 00 00:04:29.600 WRITE SECTORS(S) EXT 25 ff 01 00 00 00 e0 00 00:04:29.600 READ DMA EXT 25 ff 01 10 3b 00 e0 00 00:04:29.600 READ DMA EXT 25 ff 01 3f 00 00 e0 00 00:04:29.600 READ DMA EXT Error 6 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 1f 0e 43 e0 Error: IDNF at LBA = 0x00430e1f = 4394527 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 24 ff 01 1f 0e 43 e0 00 00:04:29.500 READ SECTOR(S) EXT 25 ff 01 1f 0e 43 e0 00 00:04:29.500 READ DMA EXT 34 ff 01 00 00 00 e0 00 00:04:29.400 WRITE SECTORS(S) EXT 35 ff 01 1f 3b 00 e0 00 00:04:29.400 WRITE DMA EXT 35 ff 01 1e 3b 00 e0 00 00:04:29.400 WRITE DMA EXT Error 5 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 1f 0e 43 e0 Error: IDNF 1 sectors at LBA = 0x00430e1f = 4394527 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 ff 01 1f 0e 43 e0 00 00:04:29.500 READ DMA EXT 34 ff 01 00 00 00 e0 00 00:04:29.400 WRITE SECTORS(S) EXT 35 ff 01 1f 3b 00 e0 00 00:04:29.400 WRITE DMA EXT 35 ff 01 1e 3b 00 e0 00 00:04:29.400 WRITE DMA EXT 35 ff 01 1d 3b 00 e0 00 00:04:29.400 WRITE DMA EXT Error 4 occurred at disk power-on lifetime: 1 hours (0 days + 1 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 1f 0e 43 e0 Error: IDNF at LBA = 0x00430e1f = 4394527 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 24 ff 01 1f 0e 43 e0 00 00:04:29.300 READ SECTOR(S) EXT 25 ff 01 1f 0e 43 e0 00 00:04:29.200 READ DMA EXT 34 ff 01 00 00 00 e0 00 00:04:29.200 WRITE SECTORS(S) EXT 35 ff 01 4e 00 00 e0 00 00:04:29.200 WRITE DMA EXT 35 ff 01 4d 00 00 e0 00 00:04:29.200 WRITE DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 45709 - # 2 Short offline Completed without error 00% 45707 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.