Test: ACPI DSDT Method Semantic tests. Test Method Names. 1 passed Test _AEI. 1 skipped Test _EVT (Event Method). 1 skipped Test _DLM (Device Lock Mutex). 1 skipped Test _PIC (Inform AML of Interrupt Model). 3 passed Test _CID (Compatible ID). 13 passed Test _CLS (Class Code). 1 skipped Test _DDN (DOS Device Name). 5 passed Test _HID (Hardware ID). 63 passed, 1 failed Test _HRV (Hardware Revision Number). 11 passed Test _MLS (Multiple Language String). 1 passed Test _PLD (Physical Device Location). 16 passed Test _SUB (Subsystem ID). 1 skipped Test _SUN (Slot User Number). 1 skipped Test _STR (String). 3 passed Test _UID (Unique ID). 31 passed Test _CDM (Clock Domain). 1 skipped Test _CRS (Current Resource Settings). 50 passed Test _DSD (Device Specific Data). 1 skipped Test _DIS (Disable). 8 passed Test _DMA (Direct Memory Access). 1 skipped Test _FIX (Fixed Register Resource Provider). 1 skipped Test _GSB (Global System Interrupt Base). 1 skipped Test _HPP (Hot Plug Parameters). 1 skipped Test _MAT (Multiple APIC Table Entry). 1 skipped Test _PRS (Possible Resource Settings). 10 passed Test _PRT (PCI Routing Table). 24 passed Test _PXM (Proximity). 1 skipped Test _SLI (System Locality Information). 1 skipped Test _CCA (Cache Coherency Attribute). 1 skipped Test _EDL (Eject Device List). 1 skipped Test _EJD (Ejection Dependent Device). 1 skipped Test _EJ0 (Eject). 1 skipped Test _EJ1 (Eject). 1 skipped Test _EJ2 (Eject). 1 skipped Test _EJ3 (Eject). 1 skipped Test _EJ4 (Eject). 1 skipped Test _LCK (Lock). 1 skipped Test _RMV (Remove). 1 skipped Test _STA (Status). 77 passed Test _DEP (Operational Region Dependencies). 32 passed Test _FIT (Firmware Interface Table). 1 skipped Test _BDN (BIOS Dock Name). 1 skipped Test _BBN (Base Bus Number). 1 passed Test _DCK (Dock). 1 skipped Test _INI (Initialize). 35 passed, 1 warning Test _GLK (Global Lock). 1 skipped Test _SEG (Segment). 1 skipped Test _LSI (Label Storage Information). 1 skipped Test _CBR (CXL Host Bridge Register). 1 skipped Test _OFF (Set resource off). 24 passed Test _ON_ (Set resource on). 24 passed Test _DSW (Device Sleep Wake). 8 passed Test _IRC (In Rush Current). 1 skipped Test _PRE (Power Resources for Enumeration). 1 skipped Test _PR0 (Power Resources for D0). 4 passed Test _PR1 (Power Resources for D1). 1 skipped Test _PR2 (Power Resources for D2). 3 passed Test _PR3 (Power Resources for D3). 4 passed Test _PRW (Power Resources for Wake). 50 passed Test _PS0 (Power State 0). 13 passed, 3 failed Test _PS1 (Power State 1). 1 skipped Test _PS2 (Power State 2). 1 passed Test _PS3 (Power State 3). 13 passed, 3 failed Test _PSC (Power State Current). 11 passed Test _PSE (Power State for Enumeration). 1 skipped Test _PSW (Power State Wake). 1 skipped Test _S1D (S1 Device State). 1 skipped Test _S2D (S2 Device State). 1 skipped Test _S3D (S3 Device State). 1 passed Test _S4D (S4 Device State). 1 passed Test _S0W (S0 Device Wake State). 9 passed Test _S1W (S1 Device Wake State). 1 skipped Test _S2W (S2 Device Wake State). 1 skipped Test _S3W (S3 Device Wake State). 1 passed Test _S4W (S4 Device Wake State). 1 passed Test _RST (Device Reset). 20 passed Test _PRR (Power Resource for Reset). 20 passed Test _S0_ (S0 System State). 1 passed Test _S1_ (S1 System State). 1 skipped Test _S2_ (S2 System State). 1 skipped Test _S3_ (S3 System State). 1 passed Test _S4_ (S4 System State). 1 passed Test _S5_ (S5 System State). 1 passed Test _SWS (System Wake Source). 1 skipped Test _PSS (Performance Supported States). 1 skipped Test _CPC (Continuous Performance Control). 1 skipped Test _CSD (C State Dependencies). 1 skipped Test _CST (C States). 1 skipped Test _PCT (Performance Control). 1 skipped Test _PDL (P-State Depth Limit). 1 skipped Test _PPC (Performance Present Capabilities). 1 skipped Test _PPE (Polling for Platform Error). 1 skipped Test _PSD (Power State Dependencies). 1 skipped Test _PTC (Processor Throttling Control). 1 skipped Test _TDL (T-State Depth Limit). 1 skipped Test _TPC (Throttling Present Capabilities). 1 skipped Test _TSD (Throttling State Dependencies). 1 skipped Test _TSS (Throttling Supported States). 1 skipped Test _LPI (Low Power Idle States). 1 skipped Test _RDI (Resource Dependencies for Idle). 1 skipped Test _PUR (Processor Utilization Request). 1 passed Test _MSG (Message). 1 skipped Test _SST (System Status). 1 skipped Test _ALC (Ambient Light Colour Chromaticity). 1 skipped Test _ALI (Ambient Light Illuminance). 1 skipped Test _ALT (Ambient Light Temperature). 1 skipped Test _ALP (Ambient Light Polling). 1 skipped Test _ALR (Ambient Light Response). 1 skipped Test _LID (Lid Status). 1 passed Test _GTF (Get Task File). 6 passed Test _GTM (Get Timing Mode). 2 passed Test _MBM (Memory Bandwidth Monitoring Data). 1 skipped Test _UPC (USB Port Capabilities). 17 passed Test _UPD (User Presence Detect). 1 skipped Test _UPP (User Presence Polling). 1 skipped Test _GCP (Get Capabilities). 1 skipped Test _GRT (Get Real Time). 1 skipped Test _GWS (Get Wake Status). 1 skipped Test _CWS (Clear Wake Status). 1 skipped Test _SRT (Set Real Time). 1 skipped Test _STP (Set Expired Timer Wake Policy). 1 skipped Test _STV (Set Timer Value). 1 skipped Test _TIP (Expired Timer Wake Policy). 1 skipped Test _TIV (Timer Values). 1 skipped Test _NBS (NVDIMM Boot Status). 1 skipped Test _NCH (NVDIMM Current Health Information). 1 skipped Test _NIC (NVDIMM Health Error Injection Capabilities) 1 skipped Test _NIH (NVDIMM Inject/Clear Health Errors). 1 skipped Test _NIG (NVDIMM Inject Health Error Status). 1 skipped Test _SBS (Smart Battery Subsystem). 1 skipped Test _BCT (Battery Charge Time). 1 skipped Test _BIF (Battery Information). 2 passed Test _BIX (Battery Information Extended). 1 passed Test _BMA (Battery Measurement Averaging). 1 skipped Test _BMC (Battery Maintenance Control). 1 skipped Test _BMD (Battery Maintenance Data). 1 skipped Test _BMS (Battery Measurement Sampling Time). 1 skipped Test _BPC (Battery Power Characteristics). 1 skipped Test _BPS (Battery Power State). 1 skipped Test _BPT (Battery Power Threshold). 1 skipped Test _BST (Battery Status). 2 passed Test _BTP (Battery Trip Point). 1 skipped Test _BTH (Battery Throttle Limit). 1 skipped Test _BTM (Battery Time). 1 skipped Test _PCL (Power Consumer List). 3 passed Test _PIF (Power Source Information). 1 skipped Test _PRL (Power Source Redundancy List). 1 skipped Test _PSR (Power Source). 1 passed Test _GAI (Get Averaging Level). 1 skipped Test _GHL (Get Hardware Limit). 1 skipped Test _PMC (Power Meter Capabilities). 1 skipped Test _PMD (Power Meter Devices). 1 skipped Test _PMM (Power Meter Measurement). 1 skipped Test _WPC (Wireless Power Calibration). 1 skipped Test _WPP (Wireless Power Polling). 1 skipped Test _FIF (Fan Information). 1 skipped Test _FPS (Fan Performance States). 1 skipped Test _FSL (Fan Set Level). 1 skipped Test _FST (Fan Status). 1 skipped Test _ACx (Active Cooling). 10 skipped Test _ART (Active Cooling Relationship Table). 1 skipped Test _ALx (Active List). 10 skipped Test _CRT (Critical Trip Point). 8 passed Test _CR3 (Warm/Standby Temperature). 1 skipped Test _DTI (Device Temperature Indication). 1 skipped Test _HOT (Hot Temperature). 1 passed Test _MTL (Minimum Throttle Limit). 1 skipped Test _NTT (Notification Temp Threshold). 1 skipped Test _PSL (Passive List). 1 skipped Test _PSV (Passive Temp). 1 skipped Test _RTV (Relative Temp Values). 1 skipped Test _SCP (Set Cooling Policy). 1 skipped Test _TC1 (Thermal Constant 1). 1 skipped Test _TC2 (Thermal Constant 2). 1 skipped Test _TFP (Thermal fast Sampling Period). 1 skipped Test _TMP (Thermal Zone Current Temp). 8 passed Test _TPT (Trip Point Temperature). 1 skipped Test _TRT (Thermal Relationship Table). 1 skipped Test _TSN (Thermal Sensor Device). 1 skipped Test _TSP (Thermal Sampling Period). 1 skipped Test _TST (Temperature Sensor Threshold). 1 skipped Test _TZD (Thermal Zone Devices). 1 skipped Test _TZM (Thermal Zone member). 1 skipped Test _TZP (Thermal Zone Polling). 1 skipped Test _GPE (General Purpose Events). 1 passed Test _EC_ (EC Offset Query). 1 skipped Test _PTS (Prepare to Sleep). 1 passed, 2 warnings Test _TTS (Transition to State). 1 skipped Test _WAK (System Wake). 3 passed Test _ADR (Return Unique ID for Device). 116 passed Test _BCL (Query List of Brightness Control Levels S.. 1 passed Test _BCM (Set Brightness Level). 1 failed Test _BQC (Brightness Query Current Level). 1 passed Test _DCS (Return the Status of Output Device). 16 passed Test _DDC (Return the EDID for this Device). 1 skipped Test _DSS (Device Set State). 16 passed Test _DGS (Query Graphics State). 16 passed Test _DOD (Enumerate All Devices Attached to Display.. 1 passed Test _DOS (Enable/Disable Output Switching). 1 passed Test _GPD (Get POST Device). 1 skipped Test _ROM (Get ROM Data). 1 skipped Test _SPD (Set POST Device). 1 skipped Test _VPO (Video POST Options). 1 skipped Test _CBA (Configuration Base Address). 1 skipped Test _IFT (IPMI Interface Type). 1 skipped Test _SRV (IPMI Interface Revision).