The stress tests for UEFI runtime service
Affects | Status | Importance | Assigned to | Milestone | |
---|---|---|---|---|---|
Firmware Test Suite |
Fix Released
|
High
|
Ivan Hu |
Bug Description
Hi FWTS owners and experts,
Do you know why we need to do the stress test for UEFI runtime service GetNextHighMono
- https:/
Since the edk2 GetNextHighMono
- https:/
We run into this issue on several ARM embedded platforms (non-server and non-workstation systems) like RPi4 because it is common to see that ARM embedded platforms allocate NVRAM space less than 64k for UEFI variable store.
For reproducing this issue, you just need to run FWTS uefirtmisc test twice on RPi4. Each uefirtmisc test would take 36k, so you would run into this issue at the second time run.
Therefore, if we have no reason to do the stress test, can we remove it? If we have a reason, can we have a flag to enable/disable GetNextHighMono
Furthermore, can we also reduce the value of uefi_set_
For more information, please check https:/
Best Regards,
Sunny
Changed in fwts: | |
assignee: | nobody → Ivan Hu (ivan.hu) |
importance: | Undecided → High |
Changed in fwts: | |
status: | Fix Committed → Fix Released |
Add checking the resources should be the solution for this issue instead of reducing multiple times of the stress tests.
Patch has been sent for review, /lists. ubuntu. com/archives/ fwts-devel/ 2022-January/ 013448. html
https:/